Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM
نویسندگان
چکیده
The STEM (scanning transmission electron microscope) is useful device combining features of scanning and transmission electron microscopes. The sample in form of ultrathin section is scanned by the electron probe and the transmitted electrons are detected. Except the dedicated STEMs [1] this mode can exist as options in both TEM and SEM [2]. The STEM based on the SEM equipped by a transmission detector (often called as low voltage STEM) was used for presented experiments. Nowadays, the low voltage STEM is more often used, and in many cases replaces the typical TEM. Here, we report investigations of embedding media that are typically used for TEM preparation of biological samples.
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